Used Vickers Instruments Vickers Instruments Binocular Microscope for sale (1,187)

Condition: good (used), Measuring microscope, universal workshop measuring microscope, microscope Hodpfsh Tadpsx Acbefg -Manufacturer: Leitz Wetzlar, universal workshop measuring microscope -Reading accuracy: see photos -Dimension assembled: 255/245/H470 mm -Quantity: 1 pieces available -Price per piece -Dimensions transport box: 710/230/H155 mm -Total weight: 35.4 kg/pc.

Condition: used, Year of construction: 1997, diameter - cutter special 30 mm draw-in arbor diameter 40 mm Hfjdpfx Ajv Uchbjcbjg clamping height 310 mm circle diameter 80-300 mm weight 30 kg

Condition: used, 2 Carl Zeiss microscopes with accessories Hfjdpfxsurlpro Acbeg

Condition: good (used), Carl Zeiss Axiovert 40C Inverted Light Microscope The Carl Zeiss Axiovert 40C is a routine inverted microscope specifically designed for examining living cells and cell cultures in biology and medicine. Its inverted design places the objectives below the stage, enabling observation in larger culture vessels such as Petri dishes or microtiter plates. Technical Features Optics: Equipped with the ZEISS ICS (Infinity Color-corrected System) for high optical performance in all contrast modalities. Illumination: Standard with a 12 V 35 W halogen lamp for transmitted light; an HBO 50 mercury vapor lamp (model CFL) is available as an option for fluorescence applications. Contrast modalities: Supports brightfield, phase contrast, and PlasDIC. Camera connection: The Axiovert 40C features an integrated front-mounted photoport (C-mount adapter) for digital documentation. Hfodpfxeyk Dbls Acbog Find more items – new and used – in our shop! International shipping costs available upon request!

Condition: excellent (used), For sale Leica DM IL LED Microscope Hfsdpfjr Ty Nhox Acbjg Leica S40/0.45 S40 - Slider 11521253 Head: Binocular Eyepiece: HC Plan 10x/20 mm Lenses: Leica N Plan 2.5X0.07 Leica N Plan 5X0.12 Leica N Plan 10X0.25 Leica N Plan L 40×0.55 Illuminator: LED illuminator Includes various accessories and EU power cord.

Condition: excellent (used), TAMAR Type: FEMET_WI_ID071_TAMAR light microscope PLMIS Light microscope The TAMAR light microscope ID071 is used for the optical inspection of samples Hsdoh Nmtgepfx Acbsfg with a maximum size of approx. 780x650mm2 (substrate size) in the PLG clean room. Substrate size complete substrate size (780x650mm2) Objective: The objective focuses the light emanating from the observed object into a real image for the viewer. Bright field mode (BF), the light coming from the microscope is directed through the objective to the sample. High resolution, low contrast Dark field mode (DF)  Illumination mode to increase contrast, high contrast for edges and particles. Principle: The center of the incident light beam is covered, only peripheral light is directed through the objective and hits the side of the sample. Edges and particles appear bright and the smooth background dark. TAMAR light microscope ID071 X-Y Stage Software Revision 1.0 Condition: used Scope of delivery: (Autosampler as shown) (Changes and errors in the technical data, information is subject to change!) We will be happy to answer any further questions you may have over the phone.

Condition: excellent (used), Type: Jeol JSM-6490 Jeol JSM-6490 Scanning Electron Microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope featuring newly developed electron optics and an intuitive, graphical user interface (GUI) running on Microsoft Windows XP Professional. Instrument configuration includes the following features: • Magnification range: 5x – 300,000x • Acceleration voltage: 0.3 – 30 kV • Tungsten filament cathode (LaB6 cathode optional) • Large fully motorized sample stage with eccentric tilt capability, including: – Graphic navigation on the sample holder – Easy sample navigation via click-center-zoom – Field-of-view controlled navigation via two navigators – Relative coordinate navigation – Save and recall of sample positions – Adjustable stage field-of-view selection • Field-of-view correction during rotation via computer-driven eccentric rotation • Field-of-view correction during tilting via computer-driven eccentric tilting • Calculation of the possible tilt angle based on sample geometry • Automatic focus tracking when moving the sample in the Z-axis • Intelligent limit switches for all motorized axes • Stage travel: X = 125 mm Y = 100 mm Z = 5 to 80 mm (stepless) T = -10°C to +90°C R = 360° (continuous) • Secondary electron detector for high vacuum operation • Newly designed, super-conical objective lens for optimal resolution at high tilt angles • Guaranteed SE image resolution: 3 nm at 30 kV and 15 nm at 1 kV • Simultaneous live imaging with multiple detectors • Powerful image measurement functions • Movie function for recording dynamic processes • Versatile specimen chamber with numerous expansion options: free ports for EDX, WDX, EBSD, cathodoluminescence, etc. • Low-maintenance, quiet pump system consisting of a fore vacuum pump, vibration-free high-performance diffusion pump, and electromagnetic valve control • Comprehensive safety procedures against misuse and external media failure • Ergonomic, height-adjustable system table • SEM starter kit including 2 sample holders, tool kit, and 6 replacement filaments Additional equipment for SEM: • Turbomolecular pump (instead of standard diffusion pump) – Use of a turbomolecular pump eliminates the need for cooling water during SEM operation. Further SEM equipment: • PC for SEM control including TFT monitor • ΟΧ200 Bruker Quantax 200 Extended EDX System – Bruker EDX software will be transferred to new owner upon purchase • Nitrogen-free, energy-dispersive X-ray analysis system including: – SDD detector with 127 eV energy resolution or better – Detection for all elements from boron upwards – Vibration-free, maintenance-free. Peltier cooled (no nitrogen required) – Pulse processor – TFT monitor – Spectrum measurement and element identification – Fully automatic, quantitative, standardless elemental analysis – Image acquisition – Ultra-fast qualitative line scan – Ultra-fast qualitative element mapping – Data management and archiving system – Report generation and results output Hsdpfxomn Rcqe Acbefg – Data communication – Installation and user training – HyperMap – Multipoint analysis – Bruker xFlash detector (SDD) with signal processing unit SVE III Scope of delivery: (see photos) Condition: used (Subject to changes and errors in the technical data and specifications!)

Condition: excellent (used), Shimadzu Type: Prestige-21 / with AIM-8800 infrared microscope Shimadzu IR Prestige-21 infrared spectrophotometer The IRPrestige-21 is designed for both highly sensitive and broad applications in the areas of research and development. It is an excellent addition to the existing FTIR series, which covers the standard laboratory area, among other things. AIM-8800 specifications Hedpfx Acjf I Ew Hjbsfg Optics: 15 x Cassegrain objective 15 x Cassegrain condenser mirror with inlet for flushing MCT detector: with liquid nitrogen monitoring system Wavelength range: Type 1 - 5000 - 720 cm -1 Type 2 - 5000 - 650 cm -1 Electrically activated aperture XY Θ directional drive. The setting of the XY direction increments is 1 µm above the sample surface and 1° steps in the Θ direction (numerical input possible). Minimum setting value: 3µm Motor-driven XY sample stage Positioning range: X-axis: 70 mm; Y-axis: 30mm Resolution: 1 µm pitch Sample thickness: Reflection mode - ≤ 40mm Transmission mode - ≤ 10mm Operation via the keyboard of the main unit Measurement mode selection / XY stage operation (4-step speed control) / manual focusing / illumination control (Optional) Control via PC Measurement mode selection / XY stage operation / automatic centering / manual focusing / automatic focusing / illumination control / Aperture setting / Aperture preview / Measurement position and aperture setting recording (10 sample positions, 2 background positions) Environmental conditions: Ambient temperature: 15°C ~ 30°C Humidity: 70% or less External dimensions, weight: W410mm x D540mm x H520mm x 36kg Condition: used / used Scope of delivery: (See picture) (Subject to changes and errors in the technical data, information is subject to change!) We will be happy to answer any further questions you may have over the phone.

Condition: defective spare-parts repository (used), Vickers Type: HVS 1000 The HVS 1000 digital micro Vickers hardness tester has a unique and unique and precise design in the areas of mechanics, optics and light light source and is able to produce a clearer image of the indentation and therefore a more precise measurement. The main purpose and scope of application: 1.Iron and steel, non-ferrous metals, metal foils, hard alloys, metal sheets, microstructures 2. carburizing, nitriding and decarburizing layers, surface hardening layers, plating, coatings 3. glass, wafers, ceramic materials Specifications: Model HVS1000 Type Digital micro hardness tester Test forces (N) 0.098 / 0.246 / 0.49 / 0.98 / 1.96 / 2.94 / 4.90 / 9.80 Test forces (Kgf) 10 / 25 / 50 / 100 / 200 / 300 / 500 / 1000 Load control Automatic loading and release Lens indenter tower Manual Holding time (s) 0~60 Magnification of microscope x 400x for measurement, objective 40x, eyepiece 10x Hjdsrr Sqpopfx Acbsfg 100x for observation, objective 10x, eyepiece 10x Micrometer resolution (μm) 0.01 Test range 5 HV~3000 HV Dimension of the XY test table 100X100 mm Movement range of the XY test table 25X25 mm Max. Height of the sample 120mm Max. Width of the sample 110mm Hardness conversion HK, HRA, HRB, HRC, HRD, HR15N, HR30N, HR45N, R15T, HR30T, HR45T, HV, HBW Output Built-in printer, RS232 interface Power 220V, 60/50Hz Dimension (mm) 441 x 270 x 480 Net weight (kg) 35 Condition: gebraucht / used Scope of delivery: (see picture) (Changes and errors in the technical data, specifications are reserved!) We will be happy to answer any further questions you may have on the phone.

Condition: excellent (used), ZEISS Type: DSM 962 The digitized scanning electron microscope DSM 962 is equipped with an integrated 4 MB image memory, a 40 MB hard disk for internal image storage and drives for external storage of data and images. hard disk for internal image storage and drives for external storage of data and images. This makes it possible to quickly and easily gain insights into the composition and morphology of morphology of specimen surfaces far into the sub-micrometer range. With magnification range from 5x to 300,000x, both macrostructures and microstructures can be examined. as well as microstructures is possible. The range of applications can be extended considerably by adding special accessories, allowing, for example analytical investigations in micro areas of the surface are possible. The device can be operated both via conventional switching elements and via the keyboard or mouse (add-on). or mouse (add-on). Electron optics and vacuum control are conventional. Functions of the Image memory functions are operated using the keyboard or mouse (add-on). A separate information screen is located centrally on the separate information screen for displaying the menus. These operating instructions are intended as a guide to help the user achieve the best possible results with the device. results with the appliance. The explanations have been kept as simple as possible so that even a less experienced user less experienced users the necessary tools. Magnification range: 20x to 300,000x at 7 mm working distance Stages in a sequence of 1-2-3-5-10 Minimum magnification: 5x at 50 mm working distance Resolution: 4 nm - guaranteed with tungsten cathode at 30 kV, 6 mm working distance, untipped specimen 25 nm - guaranteed with tungsten cathode at 1kV, 6 mm working distance, untipped specimen 3.5 nm - guaranteed with optimal LaB6 cathode at 30 kV, 6 mm working distance, untilted specimen Scope of delivery: (DSM 962 with accessories as shown) Condition: used Hedpfefcwwnex Acbofg (Subject to changes and errors in technical data and specifications) Please ask about transportation options before purchasing. We will be happy to answer any further questions you may have over the phone.

Condition: good (used), Here we offer a handling device from ZASCHESitec. This device was used in the production of instrument panels. It consists of the following components: KBK - FPM 10 - 7,0 x 5,0 carriage - LWK 762 x 762 Hfjdpfx Acscipw Ujbsg Load lifting module - Z-L6 - 80/1280 - 1486 Load lifting device - GP10 Load capacity: 10 KG Scope of delivery: (ZASCHESitec handling device, technical documentation) Condition: used / used Further questions we can answer on the phone for you. Written order possible by email or fax

Condition: used, Stereomicroscope, projection enlarger, microscope, projector MOTIC type SL-41 Series Hedpfxjxtq Aae Acbjfg Year of manufacture: approx. 1995 Magnification lens W10X/20 Power supply 230 Volts, 50Hz - Table stand with power supply for reflected light - Height-adjustable objective head - Round column stand with large outreach, inclinable extension arm - Light source for incident light 12 Volts, 10 Watts Space requirement (L x W x H): 500 x 140 x 350 mm Weight approx. 10 kg Good condition

Condition: used, functionality: fully functional, OlympusIX70-S8F Inverted Fluorescence Phase Contrast Microscope. Hodpjuax T Ssfx Acbsfg This Olympus IX70 microscope is capable of phase contrast, DIC, and fluorescence. It comes with an ergonomic tilting binocular head with 10x eyepieces. The microscope has a front and side photo port for adding a camera. The 0.5 N.A. condenser has DP10 and DP20 DIC prisms and Ph1, PhC phase annuli installed with the IX-LWPO polarizer. The 5 position fluorescence turret contains WIBA, and NU fluorescence filters. Also included is the IX-AN analyzer and U-DICT DIC prism. The microscope has a built in 1.0x / 1.5x mag changer. Good working condition. Please check out our other listings as well.

Condition: used, functionality: fully functional, Leica Leitz DMRB 301-371.010 Microscope. The Leica Leitz DM RB microscope provides enhanced object identification by using fluorescence illumination. It also allows bright and darkfield illuminatio techniques, phase contrasts, and condenser height adjustment. Good working condition. Please check out our other listings as well. Hsdjuax E Uspfx Acbsfg

Condition: used, Specification: Excitation (light source) Bright white LED source with a median lifetime of >5 years Dimensions and weight 27 × 50 × 40 cm (W × D × H), Hedpjx I I Ulsfx Acbsfg

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-R-CL laser through-beam line sensor 47/16 04078-R, used, in good condition, 100% functional, scope of delivery as shown in the photos. Hodpfx Acsx Eugisbofg

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-T-CL laser through-beam line sensor 04078-T, used, in good condition, 100% functional, scope of delivery as shown in photos. Hfjdpfxsx Eug Aj Acbeg

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-R-CL laser transmission line sensor 29/16 03819-R, used, in good condition, 100% functional, scope of delivery as shown in the photos. Hsdpox Eugcjfx Acbjfg

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-R-CL laser through-beam line sensor 47/16 04079-R, used, in good condition, fully functional, scope of delivery as per photos. Hfodpfx Acex Eugpobsg

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-T-CL laser through-beam line sensor 47/16 04077-T, used, in good condition, 100% functional, delivery as per photos. Hjdpsx Eugvjfx Acbefg

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-T-CL Laser Through-Beam Line Sensor 47/16 04079-T, used, in good condition, 100% fully functional, delivery as per photos. Hfjdpfx Acex Eug Nobog

Condition: like new (used), Year of construction: 2024, functionality: fully functional, Scanning Electron Microscope (SEM) Zeiss XB 350 Configuration and Accessories Hodpfjw Rdvvox Acbefg • Without FIB Column • SmartSEM- and SmartFIB-Software • GIS with Pt Precursor • Integrated Plasma Cleaner • EDS Oxford Xplore 30 (incl. Interface & Software) • Automatically 200 mm Air Lock • Electrical Feed-Through (2 x 15 Channels) • Circulation Cooling • Vacuum Buffer Tank (Quiet Mode) • ... and Table, Screen, Control Panel (i.e. Unique Zeiss Keyboard + Joystick) and Misc. Probe Holders Launch: August 2024 Site: Germany, Mainz Available at short notice by arrangement. The SEM is still in operation and can be viewed and demonstrated. The device has no defects or quirks and is fully functional. Further information available on request!

Condition: new, VHX-600E, Keyence Digital Microscope - New Model: VHX-600E Type: VHX-600E Hjdoq S Ti Eepfx Acbofg Condition: New

Condition: used, functionality: unexamined, input voltage: 220 V, Used Leitz Wetzlar Measuring microscope setup (UWM) with external XY readout and power supply for lighting. Hodpfx Acewm Hqcjbsfg Manufacturer: Ernst Leitz GMBH Wetzlar Movement possibility on X and Y axis, and adjustable in height. Camera can be added on top for making recordings. Digital readout X and Y axis by means of Sony Magnescale LH31A-2

Condition: used, Optacom VC-10 Universal Measuring System Surface Roughness Tester / Contour Measuring Device Device is sold without PC and software (hardware only). Resolution in X and Z axes: 0.002 µm Resolution at the probe tip: 0.003 µm VC-10 measuring range horizontal/vertical (X-axis/Z-axis): 225 mm Measuring system: optical, incremental, and non-contact in all axes (X, Z, T) Accuracy: +/- (0.5 + L/100) µm Maximum measuring force: 10 - 150 mN Measuring speed: 0.1 – 2 mm/sec (automatically optimized) Probe tip radius: 0.002 – 1 mm Measurable slopes: 78° upwards; 87° downwards VC-10 dimensions (W x D x H): 950 x 380 x 725 mm VC-10 weight (approx.): 150 kg Description has been adopted as provided. You are welcome to arrange an on-site inspection. Hfsdpfxoybbd So Acbeg Upon request, we can organize affordable shipping for you! You will receive a proper invoice. For international customers, a net invoice can be issued provided a valid VAT ID number is supplied. Subject to prior sale. Visit our shop and check out our other offers as well. The company names and trademarks mentioned are the property of their respective owners and are used only for identification and description of the products. Deviations from technical data and errors in the description of the item may occur and are subject to change.