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Tire durability testing machine Tianjin Jiurong Radtechnik TJR-2-PC/LT (JC)

Fulda

6,811 km

Tire durability testing machine
Tianjin Jiurong RadtechnikTJR-2-PC/LT (JC)

32 days left

Details

Condition: used, Year of construction: 2011, functionality: fully functional, PC/LT Tire Endurance Testing Machine 1. Manufacturer • Manufacturer: Tianjin Jiurong Wheel Tech Co., Ltd. • Country of origin: People's Republic of China 2. Machine Identification • Model: TJR-2-PC/LT (JC) • Machine type: PC/LT Tire Endurance Testing Machine • Internal identification: “Tianjin 8” • Serial number: B1060 • Year of manufacture: August 2011 Kodpsx Iunlefx Aanjfa 3. Intended Purpose • Durability and endurance testing of passenger car (PC) and light truck (LT) tires • Designed for high-speed and load-controlled tire testing 4. Test Drum and Capacity • Test drum diameter: 2,000 mm • Test drum width: 500 mm • Tire diameter range: 500 – 1,000 mm • Rim diameter range: 12" – 24" 5. Mechanical and Performance Data • Maximum speed (V/MAX): 350 km/h • Maximum test load: 25 kN (approx. 2,500 kg) • Camber angle adjustment range: –6° to +6° 6. Drive System • High-power AC electric motor • Power transmission via multi-belt drive system 7. Electrical and Performance Data • Rated power: 120 kW • Electrical connection: 400 V / 50 Hz • Rated current: 220 A 8. Control and Automation • Control unit (HMI): Allen-Bradley PanelView 550 9. Electrical Equipment • Stand-alone control cabinet • Control cabinet manufacturer: Rittal • Integrated active cooling unit 10. Physical Data • Machine weight: 15,000 kg • Overall dimensions (L × W × H): – 7,064 × 2,795 × 2,050 mm

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Scanning Electron Microscope (PC-SEM) Jeol JSM-6490 Bruker XFlash Detektor

Borken

7,009 km

Scanning Electron Microscope (PC-SEM)
JeolJSM-6490 Bruker XFlash Detektor

€35,000

fixed price plus VAT

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Condition: excellent (used), Type: Jeol JSM-6490 Jeol JSM-6490 Scanning Electron Microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope featuring newly developed electron optics and an intuitive, graphical user interface (GUI) running on Microsoft Windows XP Professional. Instrument configuration includes the following features: • Magnification range: 5x – 300,000x • Acceleration voltage: 0.3 – 30 kV • Tungsten filament cathode (LaB6 cathode optional) • Large fully motorized sample stage with eccentric tilt capability, including: – Graphic navigation on the sample holder – Easy sample navigation via click-center-zoom – Field-of-view controlled navigation via two navigators – Relative coordinate navigation – Save and recall of sample positions – Adjustable stage field-of-view selection • Field-of-view correction during rotation via computer-driven eccentric rotation • Field-of-view correction during tilting via computer-driven eccentric tilting • Calculation of the possible tilt angle based on sample geometry • Automatic focus tracking when moving the sample in the Z-axis • Intelligent limit switches for all motorized axes • Stage travel: X = 125 mm Y = 100 mm Z = 5 to 80 mm (stepless) T = -10°C to +90°C R = 360° (continuous) • Secondary electron detector for high vacuum operation • Newly designed, super-conical objective lens for optimal resolution at high tilt angles • Guaranteed SE image resolution: 3 nm at 30 kV and 15 nm at 1 kV • Simultaneous live imaging with multiple detectors • Powerful image measurement functions • Movie function for recording dynamic processes • Versatile specimen chamber with numerous expansion options: free ports for EDX, WDX, EBSD, cathodoluminescence, etc. • Low-maintenance, quiet pump system consisting of a fore vacuum pump, vibration-free high-performance diffusion pump, and electromagnetic valve control • Comprehensive safety procedures against misuse and external media failure • Ergonomic, height-adjustable system table • SEM starter kit including 2 sample holders, tool kit, and 6 replacement filaments Additional equipment for SEM: • Turbomolecular pump (instead of standard diffusion pump) – Use of a turbomolecular pump eliminates the need for cooling water during SEM operation. Further SEM equipment: • PC for SEM control including TFT monitor • ΟΧ200 Bruker Quantax 200 Extended EDX System – Bruker EDX software will be transferred to new owner upon purchase • Nitrogen-free, energy-dispersive X-ray analysis system including: Ksdpfx Asmn Rcqeanofa – SDD detector with 127 eV energy resolution or better – Detection for all elements from boron upwards – Vibration-free, maintenance-free. Peltier cooled (no nitrogen required) – Pulse processor – TFT monitor – Spectrum measurement and element identification – Fully automatic, quantitative, standardless elemental analysis – Image acquisition – Ultra-fast qualitative line scan – Ultra-fast qualitative element mapping – Data management and archiving system – Report generation and results output – Data communication – Installation and user training – HyperMap – Multipoint analysis – Bruker xFlash detector (SDD) with signal processing unit SVE III Scope of delivery: (see photos) Condition: used (Subject to changes and errors in the technical data and specifications!)

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