Measuring system
ASML YieldStar S-200B

Year of construction
2011
Condition
Used
Location
Dresden Germany
Measuring system ASML YieldStar S-200B
more Images
ASML YieldStar S-200B
Show images
Show map

Machine data

Machine type:
Measuring system
Manufacturer:
ASML
Model:
YieldStar S-200B
Year of construction:
2011
Condition:
excellent (used)
Functionality:
fully functional

Price & Location

Location:
Heilbronner Str. 22, 01189 Dresden, Deutschland Germany
Call

Details about the offer

Listing ID:
A19967480
Reference number:
DV10125
Update:
10.09.2025

Description

Optical overlay metrology system, Advanced Semiconductor Materials Lithography stand-alone overlay metrology system for 300 mm wafers, YieldStar S 200B

Model: S200B
Hfedjxbnt Ejpfx Adwjb
Type: YieldStar
Year of manufacture: 2011

Technical data:
Wafer size: 300 mm (12")
Laser source: LPPS, water cooling

General information:
The YSS200B is an optical overlay measurement system used for fast and highly precise measurement of overlay deviations on 300 mm wafers – typically for post-etch monitoring and production process control as a stand-alone system.

The listing was translated automatically. Translation errors are possible.

Seller

Registered since: 2014

100 listings online

Call

Send inquiry

Countryus 
Germany
Austria
Switzerland
United States
United Kingdom
France
Belgium
Spain
Mexico
Italy
Netherlands
Poland
Russian Federation
Belarus
Ukraine
Estonia
Turkey
New Zealand
Ireland
Czech Republic
Denmark
Finland
Sweden
Norway
Luxembourg
Greece
Lithuania
Latvia
Iceland
Portugal
Brazil
Venezuela
Argentina
Hungary
Slovakia
Romania
Moldova
Slovenia
Serbia
Montenegro
Albania
Croatia
Bulgaria
Macedonia
Bosnia and Herzegovina
Israel
Egypt
Morocco
India
Indonesia
South Korea
Japan
Thailand
Malaysia
Vietnam
China
Taiwan
Iran
Bangladesh
Note: Your inquiry will be forwarded to all sellers in this machine category. This allows you to receive a large number of offers.
The inquiry could not be sent. Please try again later.

Telephone & Fax

+49 351 8... show