Measuring systemASML
YieldStar S-200B
Measuring system
ASML
YieldStar S-200B
Year of construction
2011
Condition
Used
Location
Dresden 

Show images
Show map
Machine data
- Machine type:
- Measuring system
- Manufacturer:
- ASML
- Model:
- YieldStar S-200B
- Year of construction:
- 2011
- Condition:
- excellent (used)
- Functionality:
- fully functional
Price & Location
- Location:
- Heilbronner Str. 22, 01189 Dresden, DE
Call
Details about the offer
- Listing ID:
- A19967480
- Reference number:
- DV10125
- Update:
- 10.09.2025
Description
Optical overlay metrology system, Advanced Semiconductor Materials Lithography stand-alone overlay metrology system for 300 mm wafers, YieldStar S 200B
Fgsdpfx Aajxbnt Ejbjh
Model: S200B
Type: YieldStar
Year of manufacture: 2011
Technical data:
Wafer size: 300 mm (12")
Laser source: LPPS, water cooling
General information:
The YSS200B is an optical overlay measurement system used for fast and highly precise measurement of overlay deviations on 300 mm wafers – typically for post-etch monitoring and production process control as a stand-alone system.
The listing was translated automatically. Translation errors are possible.
Fgsdpfx Aajxbnt Ejbjh
Model: S200B
Type: YieldStar
Year of manufacture: 2011
Technical data:
Wafer size: 300 mm (12")
Laser source: LPPS, water cooling
General information:
The YSS200B is an optical overlay measurement system used for fast and highly precise measurement of overlay deviations on 300 mm wafers – typically for post-etch monitoring and production process control as a stand-alone system.
The listing was translated automatically. Translation errors are possible.
Documents
Seller
Note: Register for free or log in, to access all information.
Registered since: 2014
Telephone & Fax
+49 351 8... show
Your listing has been deleted successfully
An error has occurred