Zeiss O-Inspect 442 Multisensory CMMZeiss
O-Inspect 442 Zeiss Calypso
Zeiss O-Inspect 442 Multisensory CMM
Zeiss
O-Inspect 442 Zeiss Calypso
Year of construction
2012
Condition
Used
(fully functional)
Location
Saarbrücken 

Basic data
- Machine type:
- Zeiss O-Inspect 442 Multisensory CMM
- Manufacturer:
- Zeiss
- Model:
- O-Inspect 442 Zeiss Calypso
- Year of construction:
- 2012
- Condition:
- good (used)
- Functionality:
- fully functional
Price & Location
- Location:
- An den Ziegelhütten 19-21, 66127 Saarbrücken, Deutschland

Call
Technical details
Power details
Input voltage:
230 V
Equipment
Lighting
Documentation and certification
Type plate available
Axis specifications
Travel distance X-axis:
400 mm
Travel distance Y-axis:
400 mm
Travel distance Z-axis:
200 mm
Measuring range X-axis:
400 mm
Measuring range Y-axis:
400 mm
Measuring range Z-axis:
200 mm
Details about the offer
- Listing ID:
- A17230982
- Update:
- 02.04.2026
Description
Year of manufacture: 2012
Tactile:
Vast XXT
E0 X/Y (1D) in [μm] at 20 ±2 °C 1.7 + L/250
E0 XY (2D) in [μm] at 20 ±2 °C 1.7 + L/250
Fpsdpfxjuq Nfhs Ap Djn
E0 (3D) in [μm] at 20 ±2 °C 1.9 + L/250
Scanning probing deviation
MPE according to ISO 10360-4:2000 THP at 2.7 [μm]
Single probe probing deviation form
MPE according to ISO 10360-5:2010
PFTU 1.9 [μm]
Camera system:
Zeiss Discovery 12
EB X/Y (1D) 5) in [μm] at 20 ±2 °C 1.7 + L/250
EB XY (2D) 5) in [μm] at 20 ±2 °C 1.7 + L/250
Probe deviation MPE according to ISO 10360-7:2011
PF2D 5) 1.7 [μm]
Probe deviation of the image processing system
MPE according to ISO 10360-7:2011
PFV2D 5) 1.2 [μm]
Possible services: delivery, commissioning
Tactile:
Vast XXT
E0 X/Y (1D) in [μm] at 20 ±2 °C 1.7 + L/250
E0 XY (2D) in [μm] at 20 ±2 °C 1.7 + L/250
Fpsdpfxjuq Nfhs Ap Djn
E0 (3D) in [μm] at 20 ±2 °C 1.9 + L/250
Scanning probing deviation
MPE according to ISO 10360-4:2000 THP at 2.7 [μm]
Single probe probing deviation form
MPE according to ISO 10360-5:2010
PFTU 1.9 [μm]
Camera system:
Zeiss Discovery 12
EB X/Y (1D) 5) in [μm] at 20 ±2 °C 1.7 + L/250
EB XY (2D) 5) in [μm] at 20 ±2 °C 1.7 + L/250
Probe deviation MPE according to ISO 10360-7:2011
PF2D 5) 1.7 [μm]
Probe deviation of the image processing system
MPE according to ISO 10360-7:2011
PFV2D 5) 1.2 [μm]
Possible services: delivery, commissioning
Seller
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