Scanning Electron Microscope (Tabletop)JEOL
JCM-7000
Scanning Electron Microscope (Tabletop)
JEOL
JCM-7000
Year of construction
2024
Condition
Ex-display machine
(fully functional)
Location
Freising 

Basic data
- Machine type:
- Scanning Electron Microscope (Tabletop)
- Manufacturer:
- JEOL
- Model:
- JCM-7000
- Year of construction:
- 2024
- Condition:
- as good as new (ex-display)
- Functionality:
- fully functional
Price & Location
- Location:
- Freising, Germany

Call
Details about the offer
- Listing ID:
- A22407382
- Update:
- 24.07.2026
Description
The JCM-7000 combines simple sample navigation with a range of advanced automatic functions. A large sample chamber, high resolution, and an optional low vacuum mode for non-conductive samples make this desktop SEM a versatile, mobile all-rounder.
Godpezn Ih Aofx Ap Dekc
Features:
• SE/BSE detection
• Magnification up to x100,000, resolution approx. 8 nm
• Low vacuum operation for non-conductive samples
• Hardware and software integrated EDX system for elemental characterization
• Live elemental analysis, live imaging (including 3D imaging/topography)
• Intuitive operation with recipes, automatic functions, image montages, etc.
• Large chamber for samples up to 80 mm diameter and 50 mm height
• Compact & mobile
• Dimensions (Main Unit): 324 mm W x 586 mm D x 566 mm H
The listing was translated automatically. Translation errors are possible.
Godpezn Ih Aofx Ap Dekc
Features:
• SE/BSE detection
• Magnification up to x100,000, resolution approx. 8 nm
• Low vacuum operation for non-conductive samples
• Hardware and software integrated EDX system for elemental characterization
• Live elemental analysis, live imaging (including 3D imaging/topography)
• Intuitive operation with recipes, automatic functions, image montages, etc.
• Large chamber for samples up to 80 mm diameter and 50 mm height
• Compact & mobile
• Dimensions (Main Unit): 324 mm W x 586 mm D x 566 mm H
The listing was translated automatically. Translation errors are possible.
Seller
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